Micrographs imaged using the Gatan OnPoint BSE detector in a Zeiss Gemini 300 VP FESEM equipped with a Gatan 3View automatic microtome. The system was set to cut 40 nm slices, imaged with gas injection setting at 40% (2.9*10^-3 mBar) with Focus Charge Compensation to reduce electron accumulation charging artifacts. Images were recorded after each round of sectioning from the blockface using the SEM beam at 1.5 keV with a beam aperture size of 30 μm and a dwell time of 2.0 μsec/pixel.
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Archives and downloads the selected files into an uncompressed zip file.
Depending on the number and size of files to be downloaded, this can take an enormous amount of time.
Also, this feature is unstable and may not work properly, and checksums of downloaded files are not verified.
We recommend using rsync, aspera, globus, etc.
Download a list of selected files.
It is possible to download files by specifying the file list with rsync command, etc.
