Micrographs imaged using the Gatan OnPoint BSE detector in a Zeiss Gemini 300 VP FESEM equipped with a Gatan 3View automatic microtome. The system was set to cut 40 nm slices, imaged with gas injection setting at 40% (2.9*10^-3 mBar) with Focus Charge Compensation to reduce electron accumulation charging artifacts. Images were recorded after each round of sectioning from the blockface using the SEM beam at 1.5 keV with a beam aperture size of 30 μm and a dwell time of 2.0 μsec/pixel.
