diffraction images

SMV

8

(4096, 4096)

SIGNED 16 BIT INTEGER

(51.0, 51.0)

The data is collected on FEI Tecnai F20 200kV microscope. The electron wavelength is 0.02507 Angstrom. The final dataset is merged from 8 crystals. Each zip file contains one set of MicroED data (in SMV/img format) collected from one crystal. Each img file covers an 1 degree wedge (accumulating 0.0572 electron per squared Angstrom in a 5.72 seconds exposure). Since some data processing softwares (such as HKL2000) only support specific cameras used in X-ray crystallography, the pixel size of diffraction images has been set to 51 micrometers to imitate 4k x 4k ADSC Q210 camera, and the corresponding equivalent camera length has been saved in the header of img files and could be recognized by data processing softwares. The beam center information of each dataset is saved in the corresponding cec file and should be manually input to data processing softwares.

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